Semiconductor Assessment Services is the world's foremost provider of carrier concentration profiles in silicon, as measured using the Spreading Resistance Technique, commonly known as SRP or SRA.
The company was founded over 12 years ago by Dr Marek Pawlik, a leading authority on semiconductor characterisation. We have provided precision measurements to companies world-wide from Europe to the Pacific Rim.
We have a policy of continual research and development to ensure that our measurement capabilities are ahead of industry requirements. We have a unique capability for profiling Ultra-Shallow layers for the next generation of device technologies. We are also often able to provide high resolution profiles on real devices without the need for special test sample preparation.
This site shows examples of the type of analysis that we routinely undertake and gives details of the requirements for supplying material for analysis. All work undertaken is guaranteed for accuracy.
We also offer our proprietary diamond polishing compound which produces surfaces of unparalleled quality. This can be used for preparing samples for Spreading Resistance measurements or for any other materials preparation requiring the highest quality surface finishes.
Please contact us for further information or for a quotation. We will be pleased to discuss your specific requirements with you and our pricing policy reflects the complexity of the analysis required as well as the required turnaround time.
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